The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 1989
Filed:
Jul. 29, 1987
Michael D Morris, Ann Arbor, MI (US);
Teng-Ke J Pang, Palo Alto, CA (US);
Konan Peck, San Leandro, CA (US);
The Regents of the Univerity of Michigan, Ann Arbor, MI (US);
Abstract
This invention relates to an absorbance detector particularly adapted to liquid chromatography testing. In modern chromatography techniques, light is focused within a small capacity test sample cell, and an optical system is provided to measure the absorbance of various frequencies of light to thereby identify the existence of selected compounds. Inaccuracies of presently available detecting devices result since localized heating within the test cell generates localized index of refraction variations which refract the light in a random fashion such that it is not sensed by the detector. Additional distorting effects are caused by imperfections in the optical surfaces of the system and turbulence due to fluid flow within the sample cell. In accordance with this invention, an appropriate phase conjugator in the form of a retroreflective array is placed in the path of light exiting the sample cell. The array redirects the light rays along their original paths such that they are again distorted but in a reverse sense from the original distortion. In this manner, all of the distorting effects are compensated for. In addition, various means are employed to eliminate the effects of specular reflection from the various optical elements within the system.