The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 1989
Filed:
Mar. 09, 1987
Andrew W Krause, Baltimore, MD (US);
Charles G Marianik, Plainsboro, NJ (US);
Ronald J Kovach, Langhorne, PA (US);
Photon Technology International, Inc., Princeton, NJ (US);
Abstract
A dual wavelength spectrophotometer produces a relatively small, high power, high duty cycle light spot from a single relatively low power multi-chromatic light source. A Xenon arc lamp light source is focused by an ellipsoidal mirror onto a rotating partially reflective optical chopper. The chopper comprises a wheel having mirrored segments alternately separated by transparent segments. Light reflected by the mirrored segments passes through a first monochromator which produces a first monochromatic light beam. Light transmitted through the transparent segments passes through a second monochromator and emerges as a second monochromatic light beam having a wavelength different from the wavelength of said first monochromatic light beam. The first and second monochromatic light beams are recombined into a single dual wavelength light beam that is reflected through a sample to be analyzed. Reflective front surfaces are employed throughout the system in order to minimize power loss.