The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 1989
Filed:
Apr. 02, 1987
Applicant:
Inventors:
Ken-ichi Matsushita, Osaka, JP;
Taira Okamoto, Osaka, JP;
Masahiko Shimada, Miyagi, JP;
Hisao Takeuchi, Hyogo, JP;
Assignee:
Sumitomo Electric Industried Limited, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73789 ; 73849 ;
Abstract
Herein disclosed is a transverse resonance measurement device for measuring the Young's modulus and/or internal friction of the plate specimen of a material over a wide temperature range even if the material is nonconductive, e.g., ceramics, wood or plastics. Platinum paste is applied to one side of a plate specimen to be measured, and is baked into a platinum electrode.
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Matsushita, Ken-ichi. (1989). Device for measuring young's modulus and internal friction of specimen (U.S. Patent No. 4794798). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4794798
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile