The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 1988
Filed:
Oct. 15, 1986
Applicant:
Inventor:
John E Greivenkamp, Jr, Rochester, NY (US);
Assignee:
Eastman Kodak Company, Rochester, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
364562 ; 364525 ; 364563 ; 356357 ; 250550 ;
Abstract
The measurement range of Moire contouring techniques is extended beyond the Nyquist frequency limit by constraining the reconstruction of a surface contour according to a priori knowledge about the surface. In one example the a priori knowledge is that the surface is smooth, being described by a function having continuous derivatives, and the location of a region where the surface changes by less than C/2 per sample. In another example, the a priori knowledge is the location and height of a step discontinuity to within C/2, where C is the contour interval.