The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 1988

Filed:

Apr. 17, 1987
Applicant:
Inventors:

Ivan Cindrich, Plymouth, MI (US);

Walter G Carrara, Ann Arbor, MI (US);

Ivan J LaHaie, Dexter, MI (US);

Anthony M Tai, Plymouth, MI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S / ; G01S / ;
U.S. Cl.
CPC ...
342424 ; 342 25 ;
Abstract

A passive detection and imaging system employs interferometric and synthetic aperture techniques. A moving platform employs a pair of sensors which receive thermal electromagnetic radiations from an area of interest. The received signals are narrow band filtered by a bank of filters covering an extended bandwidth. Signals from similar narrow bands from different sensors are correlated. The plurality of frequencies and plurality of positions relative to the area of interest due to the platform motion enable generation of an inverse Fourier transform image which is resolvable in both azimuth and range. Separate preferred embodiments operating at microwave frequencies and optical frequencies are disclosed. An achromatic optical interferometric correlation technique is also disclosed.


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