The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 1988

Filed:

Jun. 24, 1987
Applicant:
Inventors:

Gunter Fetzer, Gundelfingen, DE;

Jurgen Kaufmann, Denzlingen, DE;

Hans-Jurgen Schneider, Emmendingen, DE;

Frank Strohbusch, Denzlingen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250373 ; 250343 ; 250347 ; 2505 / ; 356437 ;
Abstract

A spectroanalytical gas measuring apparatus has a radiation source (36), a transmitting condensor (19), an objective (13) and a beam divider (11) which deflects at least a part of the radiation reflected back to the apparatus by a reflector (40) to a polychromator or spectrometer (32). The transmitted radiation falls after the beam divider (11) onto a deflecting mirror (12) which is adjustable between two positions and which directs the light to an objective reflector (13). The objective reflector (13) reflects the radiation to a follow-up mirror (15) arranged opposite to the beam passage opening (14). At least one long and one short focal length objective reflector (13) are provided in order to ensure different ranges of distance in conjunction with the adjustable deflecting mirror (12).


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