The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 1988
Filed:
Nov. 25, 1985
Applicant:
Inventors:
Gerhard Kasper, Downers Grove, IL (US);
Horng Y Wen, Brookfield, IL (US);
Assignee:
Liquid Air Corporation, Walnut Creek, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
436 36 ; 73 6 / ; 356 36 ; 356 37 ; 356335 ; 356336 ; 436164 ; 436181 ;
Abstract
Method and apparatus for the measurement of sub-ppm concentrations of impurities in liquids. The liquid to be measured for impurities is dispersed into uniform droplets of a precisely known diameter D in a gas stream, such as air, using for example, a vibratory orifice generator. The dispersed droplets evaporate in the gas stream to leave a residue particle having a diameter d, which can be measured for example by means of a laser light scattering spectrometer. The concentration by volume, C.sub.v, of the impurities can then be calculated according to the equation; C.sub.v =(d/D).sup.3.