The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 1988
Filed:
Aug. 16, 1985
Applicant:
Inventors:
Salim N Jabr, Woodland Hills, CA (US);
Thomas M Crawford, Thousand Oaks, CA (US);
Assignee:
Litton Systems, Inc., Beverly Hills, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356445 ; 356124 ; 356447 ;
Abstract
A method and associated apparatus for measuring the intensity decay time of an optical cavity is particularly useful for accurate measurement of cavities of the type that include highly reflective mirrors. In the method, apparatus is provided for generating at least one pulse of laser light having a bandwidth that exceeds the resonant frequency spacing of the optical cavity and for directing that pulse into the cavity. The intensity of the light within the cavity is then measured and the amount of time is determined for such intensity to decay from a first predetermined value to a second predetermined value.