The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 1988

Filed:

Apr. 24, 1985
Applicant:
Inventors:

Atsushi Kuramoto, Kure, JP;

Yukio Fukayama, Hiroshima, JP;

Shigeyoshi Kawano, Kure, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F01J / ;
U.S. Cl.
CPC ...
364557 ; 364558 ; 374137 ; 290 / ; 60646 ;
Abstract

Thermal stress of a metal portion of a pressure-tight tube is calculated on the basis of calculated values of a temperature distribution calculator for calculating the distribution of temperature at positions equidistantly arranged in a direction of the thickness of the aforesaid tube on the basis of measured values of metal portion of the aforesaid tube, whereby the thermal stress being changed momently is accurately measured and monitored. Further, there is provided a calculation cycle setter for presetting calculation cycles on the basis of measured values of the fluid temperature in the aforesaid tube. The calculation cycles are made short when fluctuations in the measured values of the fluid temperature are large, while, the calculation cycles are made long when fluctuations in the measured values of the fluid temperature are small.


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