The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 1988
Filed:
Sep. 08, 1987
Kazunori Naganuma, Katsuta, JP;
Juichi Noda, Mito, JP;
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Abstract
A method and apparatus for measuring ultrashort optical pulses is described. Pulse waveforms to be measured are the type which vary at high speed in a time close to or less than the response time of an optical detector. Changes of optical wavelength or frequency are measured at various sections of that pulse. The light to be measured is split into two beams, and recombined after provided with different delay times, respectively. The combined light is caused to enter a doubling crystal to generate a second-harmonic light, and the second-harmonic light component, or both the second-harmonic and fundamental components, is measured. The intensity shape and chirping of the pulses is obtained from the changes in the intensity of these components as a function of delay time difference by Fourier analysis including iterative arithmetic operations.