The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 1988
Filed:
Apr. 16, 1987
James D Pratt, Jr, Raleigh, NC (US);
Ralph L Ely, Jr, Durham, NC (US);
Troxler Electronic Laboratories, Inc., Research Triangle Park, NC (US);
Abstract
Nuclear density gauges of the type having a gamma source which is positionable at several different source depth positions with respect to a detector are calibrated in an efficient and advantageous manner by a calibration procedure which reduces the number of experimental counts which must be taken. In accordance with the present invention, a single calibration block is employed and counts are taken at one or more source depth positions on the block. Through the use of historically derived relationships between the count rate obtained from the calibration block to the count rates obtained from at least two different calibration blocks of other known densities, the expected calibration counting rates for the other blocks can be obtained. These calculated counting rates are then used along with the experimentally determined counting rate to obtain the calibration constants for the gauge.