The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 1988
Filed:
Dec. 24, 1987
Masanori Nagata, Tokyo, JP;
Shigeki Imano, Tokyo, JP;
Tsugio Kaneoka, Tokyo, JP;
Kiyotoshi Asada, Tokyo, JP;
Fujimori Kogyo Co., Ltd., Tokyo, JP;
Abstract
There is disclosed an apparatus and method for inspecting the contents, such as food, of a package, particularly a light-opaque package, for degradation or the degree of degradation by means of ultra-soft X-rays. The inspection apparatus generally comprises a shaking unit for shaking the package and a main inspecting unit disposed downstream and independently of the shaking unit. The assessment of degradation of the degree of degradation can be made according to the state of dispersion, after shaking, of the package head space in the X-ray image information. The method and apparatus eliminate losses arising from destructive inspection.