The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 1988
Filed:
Sep. 19, 1986
Applicant:
Inventors:
Frederick E Warren, Walnut Creek, CA (US);
Harvey B Crisler, El Sobrante, CA (US);
Robert G Jacobson, Brentwood, CA (US);
Chang H Kim, Berkeley, CA (US);
Edward C Llewellyn, Albany, CA (US);
Assignee:
Zehntel Incorporation, Walnut Creek, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 324 / ; 371 20 ;
Abstract
An in-circuit test system having means to stimulate the device-under-test at any desired electrical node of the device, means to record the device's response waveform at any node, means to edit the response waveform, and means to use the edited waveform to restimulate the same device in a subsequent in-circuit test.