The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 1988
Filed:
Dec. 05, 1985
Applicant:
Inventors:
Dieter Mann, Aschaffenburg, DE;
Dieter Fornoff, Darmstadt, DE;
Andreas Ries, Darmstadt, DE;
Eberhard Klett, Darmstadt, DE;
Michael van Suntum, Darmstadt, DE;
Assignee:
Dieter Mann GmbH, Aschaffenburg, DE;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351245 ;
Abstract
An ophthalmologic examination unit comprises a chin rest (31) and a plurality of examination instruments (30, 59, 60) whose position can be laterally adjusted relative to the patient's eyes to be examined and which can be adjusted in elevation. The chin rest (31) and the instruments (30, 59, 60) are attached to a common supporting element (13) which can be vertically adjusted by means of a drive unit (18), such that the examination procedure be rendered as simple and convenient as possible and that the instrument setting be facilitated.