The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 1988

Filed:

Jul. 10, 1987
Applicant:
Inventors:

Jean F Bussiere, St. Bruno, CA;

Cheng-Kuei Jen, Brossard, CA;

Irina D Makarow, Rawdon, CA;

Brigitte Bacroix, St. Germain en Laye, FR;

Philippe H Lequeu, La Buisse, FR;

John J Jonas, Westmount, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73597 ;
Abstract

A method of, and apparatus for, evaluating forming capabilities of metal plate by means of ultrasonic waves where the rolling direction and the density of the plate are known. The method comprises the steps of launching acoustic waves into the plate and detecting acoustic waves propagating in the plate to establish acoustic velocities in the plate along at least two different directions. Then the value of a certain plastic strain characteristic, like the average plastic strain ratio R or the planar strain ratio .DELTA.R, is determined from a previously established empirical relationship between the velocities and the value of the plastic strain ratio R(.alpha.).


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