The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 1988

Filed:

Nov. 15, 1985
Applicant:
Inventors:

Richard A Sones, Cleveland Heights, OH (US);

Karen L Lauro, South Euclid, OH (US);

Assignee:

Picker International, Inc., Cleveland, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
36441313 ; 2503 / ;
Abstract

A method and apparatus for calibrating the detector gain of a dual energy digital radiography system is provided. A basis material calibration object is scanned to create low and high energy pixel data. A regression is performed on the pixel data to derive at least one high energy calibration vector and at least one low energy calibration vector. The calibration vectors are transformed into high and low energy gain functions represented by a Taylor series expansion. An examination object is scanned to create low and high energy image data. The image data is combined with the gain function to create corrected low and high energy image data.


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