The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 1988
Filed:
Aug. 29, 1986
Koichi Onishi, Katsuta, JP;
Yoshifusa Ouchi, Ibaraki, JP;
Takashi Suganuma, Katsuta, JP;
Atsushi Utsumi, Kawanishi, JP;
Takao Kuroiwa, Amagasaki, JP;
Mitsubishi Cable Industries, Ltd., Hyogo, JP;
Doryokuro Kakunenryo Kaihatsu Jigyodan, Tokyo, JP;
Abstract
Radioactive materials can be safely analyzed by an emission spectroscopic analyzer comprising an exciting device for exciting a radioactive material to be analyzed to emit light. The exciting device is enclosed in a radiation shielding wall. A detecting device detects the emitted light. The detecting device is located outside the radiation shielding wall. A light-transmitting device is provided between the exciting device and the detecting device such that the emitted light impinging on a first end of the light-transmitting device will be received at the detecting device as light having been transmitted through the light-transmitting device and emitted from a second end of the light-transmitting device. The light-transmitting device penetrates a hole made in the radiation shielding wall which has a sealing structure to prevent radiation leakage. The light-transmitting device penetrates the hole with a curvature. A lens system is attached to the second end of the light-transmitting device to permit visual observation of the emitted light therethrough. A fine adjustment device adjusts the position of the first end of the light-transmitting device in relation to the emitted light from the material to be analyzed.