The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 1988

Filed:

May. 04, 1987
Applicant:
Inventors:

Fusao Ichikawa, Kanagawa, JP;

Kiyoharu Michimoto, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356237 ; 250563 ; 250572 ; 356431 ;
Abstract

In a method of inspecting a magnetic disk surface, a magnetic disk web is exposed to a light beam, information on the condition of reflection of the light beam by the magnetic disk web or passing of the light beam through the magnetic disk web is detected, and the condition of surface defects of a magnetic disk is judged based on results obtained by the detected information. The judgement is carried out based on the results at a portion of the magnetic disk web outside of a non-use region of the magnetic disk.


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