The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 1988
Filed:
Aug. 12, 1986
Ikuo Kawaguchi, Yokohama, JP;
Yoshihiko Hayashi, Yokohama, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A memory test apparatus for testing a high-performance memory having two or more memory functions, including a pattern generator for generating an algorithmic pattern to be inputted to a first memory block of a memory under test having at least two memory blocks, an auxiliary pattern generator for storing an output from the algorithmic pattern generator and for outputting an expected value to a second memory block of the memory under test at a preset timing based on the stored output, a comparator for comparing outputs from the first and second memory blocks with expected values for the memory blocks, and a memory for storing an output from the comparator. Since the algorithmic pattern generator and the auxiliary pattern generator are included, the test apparatus has such an affect that even if the first and second memory blocks of the memory under test operate asynchronously, the data transfer function therebetween and the performance related to the operation timing can be tested, thus providing a highly precise memory test apparatus.