The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 1988
Filed:
Dec. 24, 1984
Applicant:
Inventor:
William Ayers, Princeton, NJ (US);
Assignee:
Electron Transfer Technologies, Inc., Princeton, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324 711 ; 204 / ; 204433 ; 324 / ; 324 715 ; 3241 / ;
Abstract
Disclosed is a method of determining the state of charge and discharge of a host material, e.g., a hydride forming hydrogen storage material, or the interstitial content of an alloy material by the high frequency measurement of the time varying transfer function thereof.
Ayers, William. (1988). Method of the measurement of interstitial atoms in alloys including the (U.S. Patent No. 4788491). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4788491
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile