The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 1988

Filed:

Apr. 28, 1987
Applicant:
Inventor:

Takeshi Nakamura, Ebina, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437046 ; 437 84 ; 437101 ; 437197 ; 437914 ; 437915 ; 437944 ; 148D / ; 148D / ; 148D / ; 357-4 ; 357 237 ;
Abstract

A method for fabricating a thin-film transistor having a stagger structure, in which the inner portion of the amorphous silicon layer doped as an ohmic contact layer to source and drain areas is defined by an insulating layer interposed therebetween, a step for forming source and drain electrodes on said amorphous silicon layer, which comprises a film forming process for forming a metal layer; a thermal treatment process for heating so as to generate a surface reaction between said metal layer and said amorphous silicon layer in order to selectively form a reaction layer only on said amorphous silicon layer; and a patterning process for selectively removing said metal layer so as to form source and drain electrodes.


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