The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 1988

Filed:

Jul. 15, 1987
Applicant:
Inventor:

Masao Nohda, Yokosuka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ; G01B / ;
U.S. Cl.
CPC ...
356124 ; 351212 ; 351247 ;
Abstract

A plurality of light sources are caused to impinge in predetermined directions onto an optical system to be inspected. The reflected beams from the optical system are received by two or more pairs of photoelectric converting elements and the radius of curvature of the above mentioned optical system is measured on the basis of the phase difference of the output signals between the photoelectric converting elements forming the respective pairs. The reflected beams are first converted into a slit shaped series of beams, the angle of inclination of each of which, to which to the scanning direction, is made in two or more different known angles. An output device emitting the discriminating signal of the angle of inclination of the beams is provided and the discriminating signal and phase difference inputted to an operating circuit to obtain a refractive power.


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