The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 1988
Filed:
Aug. 08, 1985
Philip R Brierley, Madison, WI (US);
Doug Pfrang, Madison, WI (US);
Nicolet Instrument Corporation, Madison, WI (US);
Abstract
An analytical instrument includes an optical system having a source of incoming radiation (11) which in a transmission test is focused by a primary focusing element (15) onto a sample (16). The radiation transmitted through the sample is collimate by a focusing-collimating element (20) and directed across the beam of incoming radiation (14) before focused on a detector (12). To perform a test of the reflectance of the sample, an intercept element (28) is moved into position in the incoming beam (14) to deflect a portion (36) of the beam which is directed to the focusing-collimating element (20) and focused on the sample. The reflected radiation from the sample is collected by the focusing-collimating element (20) into a collimated beam (38) that is parallel and adjacent to the incoming beam, and which is directed in a path which passes by the intercept element (28) to be focused onto the detector (12). By selectively moving the intercept element (28) into and out of the path of the beam (14 ), a sample may be analyzed for both transmission and reflectance characteristics without moving the sample.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile