The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 1988
Filed:
Aug. 01, 1986
Ortwin Muller, Aalen, DE;
Albrecht Vogel, Oberkochen, DE;
Ulrich Lemcke, Heidenheim, DE;
Gerhard Hanemann, Oberkochen, DE;
Fritz Strahle, Heubach-Lautern, DE;
Franz Muchel, Konigsbronn, DE;
Erich Blaha, Essingen, DE;
Carl-Zeiss-Stiftung, Heidenheim, DE;
Abstract
In an instrument for the examination and surgery of the eye, an ophthalmological objective is combined with an operation microscope whose main objective is combined with an optical system of variable back focus and focal length. Every plane of the eye lying between the cornea and the fundus is imaged by the instrument at an intermediate image plane. In this way, with a single instrument, the operator can carry out work on the cornea, the eye lens, the vitreous body, and the retina. Since the instrument provides the observer with a reflection-free image, contact of the eye to be operated upon with an optical auxiliary means which eliminates the refractive power is unnecessary.