The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 1988
Filed:
Sep. 22, 1986
Applicant:
Inventors:
Geoffrey Harding, Halstenbeck, DE;
Josef-Maria Kosanetzky, Norderstedt, DE;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
36441316 ; 378 88 ;
Abstract
A method and apparatus for measurement of an energy-independent attenuation factor in a predetermined area of a primary X-ray beam which passes through a test object. Two detectors measure scattered radiation on closely adjacent paths in each of two different spectral ranges. The attenuation factor is calculated from the difference of the logarithms of quotients of measurements taken at different engergies.