The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 1988

Filed:

Dec. 04, 1986
Applicant:
Inventors:

Walter D McComb, Oregon, OH (US);

Richard D Schave, Perrysburg, OH (US);

Gregory S Lee, Bowling Green, OH (US);

Andrew W Rudolph, S. Elmore, OH (US);

Assignee:

Libbey-Owens-Ford Co., Toledo, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356382 ; 356405 ; 356445 ; 356236 ;
Abstract

An apparatus for determining and displaying selected characteristics of a film formed on the surface of a glass ribbon includes a scanning head mounted on a track for movement above the filmed surface of the glass ribbon. The scanning head has a source of light pulses generated from a tungsten lamp and chopper, filtered to simulate daylight and focused on the filmed surface. An integrating sphere is also mounted on the scanning head and has an entrance port formed in a wall thereof for collecting a portion of the light being reflected from the surface. Optically filtered detectors mounted in detector ports formed in the wall of the sphere generate output signals representing the 'Y' and 'Z' components of the collected light on the CIE X,Y,Z, tristimulus scale. A programmed microprocessor is responsive to the detector signals and information concerning the position of the scanning head with respect to the surface of the glass ribbon for generating visual displays of selected characteristics such as reflectivity, b* on the CIELAB tristimulus scale and overcoat thickness as a function of the position at which the light beam is reflected from the filmed surface.


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