The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 1988

Filed:

Mar. 02, 1987
Applicant:
Inventor:

Kenneth J Wayne, Saratoga, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356351 ; 356358 ;
Abstract

An optical system for an interferometer compensates for changes in temperature by incorporating optics in which the reference and measurement beams follow different but optically equivalent paths through optical elements that are in thermal equilibrium. The optical elements of the interferometer are so arranged that the reference beam and the measurement beam follow equivalent optical path lengths through the interferometer, whose elements are in thermal equilibrium. That is, the path lengths through the high refractive index media of the optics are the same length and refractive index, but do not follow the same path. Because the beams are not constrained to follow the same path, fewer optical elements are needed and shorter OPLs can be used resulting in less complexity, better optical efficiency, easier alignment and lower cost.


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