The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 1988
Filed:
Jul. 30, 1986
Katsuhiro Takada, Tokyo, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A microscope objective comprising a first lens component, a second lens component located in a range wherein the height of paraxial marginal ray becomes at least a half of the maximum height of paraxial marginal ray to be reached in the microscope objective, and a third lens component, the second lens component being arranged as a graded refractive index (GRIN) lens formed that the refractive index thereof is graded according to the radial distance from the optical axis and, moreover, the dispersion in the marginal portion thereof is different from the dispersion in the central portion thereof, the microscope objective being arranged that chromatic aberration as well as aberrations for the basic wavelength are corrected satisfactorily favorably.