The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 1988
Filed:
Mar. 21, 1985
Applicant:
Inventors:
Haruhisa Hayashi, Tokyo, JP;
Yoshiharu Oguchi, Tokyo, JP;
Kenichi Matsunaga, Tokyo, JP;
Chikao Yoshikumi, Kunitachi, JP;
Assignee:
Kureha Kagaku Kogyo Kabushiki Kaisha, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
436516 ; 2041833 ; 2042 / ; 435 29 ; 436506 ; 436519 ; 436520 ; 436548 ; 436806 ; 436811 ; 436813 ;
Abstract
Disclosed herein is a method for examining cells, comprising subjecting the cells to an antigen-antibody reaction treatment, then measuring a pattern of the electrophoretic mobility of the cells and comparing the electrophoretic property of the cells under examination with the electrophoretic property of standard cells.
Hayashi, Haruhisa. (1988). Examining cells by electrophoresis (U.S. Patent No. 4783419). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4783419
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile