The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 1988
Filed:
Mar. 26, 1987
Applicant:
Inventors:
Kazutoshi Takagi, Tokyo, JP;
Nobuaki Kitajima, Tokyo, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ;
U.S. Cl.
CPC ...
350516 ; 350526 ; 350527 ; 350528 ;
Abstract
An operation microscope in which the optical axis of the illumination optical system is in alignment with the optical axis of the objective lens of the observation optical system and the illumination rays pass along the optical axis of the objective lens. Due to this construction, it is possible to sufficiently illuminate the deep parts of diseased tissue in, for example, a cataract operation, and very easy to confirm whether or not any part of the lens remains in the capsula lentis after the removal of the lens of the eye.