The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 1988
Filed:
Sep. 18, 1987
Kenneth C Widen, Topanga, CA (US);
Richard H Burns, N. Hollywood, CA (US);
Rockwell International Corporation, El Segundo, CA (US);
Abstract
A method and apparatus for testing an optical system 64 having an optical axis and a desired optical wavefront. A hologram is formed containing a recording of the desired optical wavefront. The hologram is located on the optical axis. When the hologram 50 is played back, the desired optical wavefront 62 is produced and directed toward the optical system 64. Wavefront 62 is retroreflected from the optical system 64 containing any of the system's aberrations. The retroreflected wavefront 66 is then passed through the hologram. A reference wavefront 60 is produced which is substantially conjugate to the desired optical wavefront. The reference wavefront 60 interferes with the retroreflected desired optical wavefront 66 thereby producing an interference fringe pattern characterizing the optical system under test.