The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 1988
Filed:
Jul. 17, 1987
Ryoichi Sakai, Kanagawa, JP;
Hisashi Tamamura, Tokyo, JP;
Sony/Tektronix, Inc., , JP;
Abstract
An electronic device measurement apparatus measures a characteristic of an electronic device under test (DUT) by applying a sine-wave voltage to the DUT, detecting the voltage across the DUT as well as the current flowing through the DUT and displaying a characteristic curve in accordance with the detected voltage and current. The sine-wave voltage is generated in phase with an AC line voltage but the amplitude thereof is independent of the line voltage, and consequently the circuits in the measurement apparatus are not affected by variations in phase and amplitude in the line. Moreover, the generated sine-wave voltage is symmetrical, whereby display distortion is substantially eliminated. A voltage limiter and a current limiter are provided for limiting the voltage and current to be applied to the DUT to values determined by a display window, for protecting a current detecting resistor and a voltage divider connected to the DUT.