The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 1988
Filed:
May. 08, 1986
Applicant:
Inventors:
Assignee:
Carl-Zeiss-Stiftung, Heidenheim, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356 34 ; 356 32 ;
Abstract
A method and an apparatus for optical strain measurement are disclosed. Prior to the deformation or loading of the object to be tested, the latter is provided with a thin transparent film which adheres well to the object and has a thickness between 3 and 20 .mu.m. After the deformation or during loading, the wavelength-dependent intensity course developed because of the interference of the portion of the beam of light reflected and superimposed at the boundary surfaces of the transparent film is measured and evaluated by a computer.