The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 1988

Filed:

Mar. 26, 1985
Applicant:
Inventors:

Paul Nguyen Tan Tai, Paris, FR;

Jean-Paul Henon, Versailles, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324126 ; 324127 ; 324 96 ;
Abstract

A method and an electronic circuit for measuring very weak signals at high voltage. The electronic circuit consists of a first portion (I) constituted by at least one amplifier (2) which is DC-connected directly to a source of weak signals. This amplifier is followed by at least one current amplifier (5). A second portion of the circuit (II) then transfers the amplified current signal from high potential to the ground potential of measuring apparatus by a series of transistors (12 to 14) followed by an output amplifier (22). An optional third portion (III) may be provided to sample the signal by an analog gate (25) suitably controlled from an external frequency source. This makes it possible in spectrometry to perform fast and accurate measurements on very weak signals at high potential.


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