The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 1988

Filed:

Jun. 11, 1984
Applicant:
Inventors:

Dieter Meinecke, Mannheim, DE;

Rainer Van Rijckevorsel, Bruhl, DE;

Manfred Pauli, Schwetzingen, DE;

Rudolf Schussler, Lampertheim, DE;

Thomas Jack, Straubenhardt, DE;

Dieter Knoll, Kronberg, DE;

Assignee:

Boehringer Mannheim GmbH, Mannheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
422 68 ; 422 58 ; 422104 ; 350529 ; 356238 ; 356244 ;
Abstract

According to a first aspect, the present invention provides an apparatus for the evaluation of a longitudinally extending, flexible test carrier for the analytical determination of components of a body fluid. The test carrier has an insertion end to be inserted into the apparatus and a handling end. The test carrier is positioned and securely held in a measurement position in such a manner that its test field is present in a definite position with regard to the measurement unit. The positioning element includes at least two holding elements, one of which firmly holds the test carrier close to its insertion end and the other of which firmly holds the test carrier close to its handling end. A supporting surface being provided on which the test carrier lies at least partly in its measurement position. According to a second aspect for the evaluation of test carriers with a covering layer fixed in the manner of a flap on one edge of the test carrier, there is present a shutter element with a contact surface for pressing on the covering layer, the aperture element being mounted and operable in such a manner that the contact surface in the last phase of approaching the covering layer makes, relative to the test carrier, a tilting movement about a tilting axis which lies in close proximity to a fixing edge of the covering layer.


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