The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 1988

Filed:

Nov. 13, 1987
Applicant:
Inventor:

Toru Iwane, Yokohama, JP;

Assignee:

Nippon Kogaku K. K., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356125 ; 356127 ;
Abstract

An apparatus for measuring the optical characteristics of a lens disposed in a measuring optical system illuminated by the beams of a plurality of light sources, the apparatus includes photoelectric detecting means having a detecting surface disposed substantially orthogonal to the optical axis of the measuring optical system for detecting the positions of the light beams passed through the lens and producing a photelectric signal, optical characteristic calculating means responsive to the signal to calculate the spherical power, the cylindrical power and the principal meridians axis degree of the lens, deviation detecting means responsive to the signal to detect the amount of deviation of the central position of the light beams passed through the lens from the position of the optic axis of the measuring optical system, eccentricity calculating means for calculating the eccentricity of the optic axis of the lens from the optic axis of the measuring optical system in a two-dimensional coordinates system on the basis of the amount of deviation detected and the spherical power, the cylindrical power and the principal meridians axis degree calculated, display means for displaying at least one of the spherical power, the cylindrical power and the principal meridians axis degree, means for detecting that the amount of deviation detected is greater than a predetermined value and outputting a detection signal, and inhibiting means responsive to the detection signal to inhibit the display means from displaying at least one of the calculated spherical power, cylindrical power and the principal meridians axis degree.


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