The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 1988

Filed:

Mar. 07, 1986
Applicant:
Inventor:

John B Collins, Westport, CT (US);

Assignee:

The Perkin-Elmer Corporation, Norwalk, CT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C / ; G06F / ;
U.S. Cl.
CPC ...
36457102 ; 73 / ; 356138 ; 356346 ; 36416701 ; 364525 ;
Abstract

A method for calibrating a monochromator to compensate for mechanical imperfections in its diffraction grating and grating drive assembly employs a two stage interactive procedure which permits the use of small (0.2 nm) spectral regions for the identification of emission lines. An iterative, self-consistent, discrete Fourier transform is used for the determination of multiple positioning correction terms. When the Fourier calculations are completed, the results of the calibration procedure are presented by the system to the analyst for acceptance. If accepted, the positioning error of the primary calibration line is measured, stored and used by the system to maintain a zero centered distribution of positioning errors each time the monochromator is reinitialized.


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