The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 1988
Filed:
Mar. 25, 1987
Applicant:
Inventor:
Kyoichi Tatsuno, Yamato, JP;
Assignee:
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
250575 ; 356336 ;
Abstract
A droplet size measuring apparatus of the forward scattering method, wherein particles to be measured in a scattering zone having a predetermined scattering path length are irradiated with parallel laser beams. The irradiated beams are scattered by the particles and the scattering beams are detected by the photodetectors arranged at predetermined scattering angles. The output of the photodetectors are input to an arithmetic operating unit, thus the intensity distribution I(.theta.) of the scattered beams is measured. The droplet size distribution n(D) is calculated from the intensity distribution I(.theta.) using the following equation: