The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 1988
Filed:
Jan. 23, 1986
Daniel L Barwick, Palmyra, PA (US);
Dennis H Chestnut, Harrisburg, PA (US);
Timothy W Jones, Lancaster, PA (US);
John P Weaver, Lancaster, PA (US);
AMP Incorporated, Harrisburg, PA (US);
Abstract
An X-ray thickness monitor is mounted on a moveable carriage which also supports a duty cycle sensor and a shoulder find sensor. The duty cycle sensor is aligned to scan the same portion of a terminal strip as that which passes under the X-ray beam. The duty cycle sensor is used to measure the ratio between the widths of individual terminals in the terminal strip and the period between adjacent terminals. This duty cycle is then used as a correction factor to correct the measured thickness value in order to compensate for gaps between adjacent terminals. The shoulder find sensor monitors the duty cycle at a shoulder on the terminal and moves the carriage as necessary to maintain the shoulder find sensor in position over the shoulder, thereby maintaining the X-ray beam and the duty cycle sensor in position over the crown to be measured. The X-ray monitor is automatically standardized periodically in order to ensure the accuracy of the measurement.