The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 1988

Filed:

Oct. 02, 1987
Applicant:
Inventors:

Takashi Yokoto, Katsuta, JP;

Toshiyuki Ohashi, Katsuta, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358 93 ; 250311 ;
Abstract

An electron microscope with a television observation apparatus is equipped such that an observation image of the electron microscope on a television fluorescent screen and an image displayed on a cathode-ray tube through taking-in of the electron microscope observation image by a television camera are conformed to each other in up/down and right/left directions and composition. This can be realized by making the polarity of a deflection electrode of the television camera or a deflection electrode of the cathode-ray tube in a horizontal scanning direction reverse to a usual polarity, or by interposing an odd number of reflectors between the television fluorescent screen and the television camera.


Find Patent Forward Citations

Yokoto, Takashi. (1988). Electron microscope with television observation apparatus (U.S. Patent No. 4777523). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4777523

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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