The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 1988

Filed:

Apr. 30, 1987
Applicant:
Inventors:

Eric R Fossum, Yorktown Heights, NY (US);

Stanley S Todorov, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ; C23C / ; B05D / ; B44C / ;
U.S. Cl.
CPC ...
156653 ; 156643 ; 156657 ; 20419211 ; 427 38 ; 437 34 ; 437239 ; 437242 ;
Abstract

A low-energy oxygen and/or nitrogen ion beam with an energy level of about 60 eV is used to form an ultra-thin layer of silicon adduct on unheated silicon substrates. The ion beam is created with a single-grid Kaufman-type source and the process is performed in a vacuum chamber evacuated to a base pressure of about 3.times.10.sup.-7 torr with oxygen and/or nitrogen gases, with or without argon introduced into the chamber. FET-gate-quality oxides on the order of about 45 angstroms have been produced in the successful fabrication of n-channel MOSFET's.


Find Patent Forward Citations

Fossum, Eric. (1988). Method of forming dielectric thin films on silicon by low energy ion (U.S. Patent No. 4776925). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4776925

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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