The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 1988

Filed:

Sep. 18, 1987
Applicant:
Inventors:

Takaji Nakanishi, Tokyokawa, JP;

Koichiro Kakizawa, Okazaki, JP;

Nobuyuki Yasuda, Gamagouri, JP;

Shinichiro Shinoda, Gamagouri, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351214 ; 351205 ; 351221 ;
Abstract

An apparatus for detecting ophthalmic disease such as a cataract in the lens of a patient's eye includes means for focussing a laser beam and slit light alternatively or simultaneously at a selected spot in the lens of the eye. The slit light is used in a monitoring or adjustment mode to illuminate the selected spot and its adjacent portion on which the laser beam is to be focussed for ophthalmic disease detection, thereby making easier the identification of spots to be measured in the lens of the eye.


Find Patent Forward Citations

Nakanishi, Takaji. (1988). Apparatus for detecting ophthalmic disease (U.S. Patent No. 4776687). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4776687

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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