The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 1988
Filed:
Aug. 11, 1987
Applicant:
Inventors:
Randolph K Armstrong, Cincinnati, OH (US);
Carol S Wentzel, Green Township, Hamilton County, OH (US);
Carl G Gatton, Hamilton, OH (US);
Assignee:
Xetron Corporation, Cincinnati, OH (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
73 40 ;
Abstract
To leak test a cavity in a test item, a pressurizing gas, at a preselected pressure is applied to the test item and the flow rate of the pressurizing gas during pressurization is recorded. This recorded flow rate is compared with a threshold level based on gas flow signature data for a reference test item. If the recorded gas flow exceeds the threshold level, an excessive leak signal is produced. This leak testing method significantly reduces the time required to perform low flow rate leak detection in large volume test items.