The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 1988
Filed:
Nov. 10, 1987
Applicant:
Inventor:
Isao Ishibai, Tokyo, JP;
Assignee:
Hoya Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33551 ; 33507 ;
Abstract
To test an aspheric lens, the lens is mounted on a base shaft having a central axis so that the center of a reference curvature radius of the lens agrees with a central axis of the base shaft. A stylus mounted on a rotary table is rotated about the lens such that its center of rotation lies on the central axis. The step of stylus is maintained in contact with the surface of the aspherical lens. As the stylus is rotated in contact with the lens, both the rotational and radial position of this stylus is monitored.
Ishibai, Isao. (1988). Method and apparatus for testing aspherical lenses (U.S. Patent No. 4776101). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4776101
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile