The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 1988
Filed:
Nov. 17, 1986
Masayoshi Dehara, Tokyo, JP;
Ando Electric Co., Ltd., Tokyo, JP;
Abstract
A pattern generating apparatus for testing IC device includes an input/output mode memory, a pattern memory storing a driver pattern and an expected pattern, a driver pattern generator for outputting the driver pattern in response to the outputs of the pattern memory and the input/output mode memory, and an expected pattern generator for generating the expected pattern. The driver pattern is applied to the IC device whose output pattern is compared with the expected pattern in a comparison/decision circuit to decide whether the IC device is to be satisfactory or not. The pattern memory is of two-bit structure so that the driver pattern and the expected pattern can be varied in respect to the waveform in dependence on combinations of the two bits.