The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 1988
Filed:
Dec. 29, 1986
Joel Hecker, Port Jefferson Station, NY (US);
Howard K Stern, Greenlawn, NY (US);
Robotic Vision Systems, Inc., Hauppauge, NY (US);
Abstract
An optical spot scanning system for use in three dimensional measurement and inspection of an object surface wherein a deflector means is placed in the path of the projection axis of the spot projector to deflect the portion of same between the deflector and the object surface, thereby moving the spot to various positions on the object surface, and wherein the deflector means is also positioned in the path of the optical axis of the system sensing means to deflect the portion of same between the sensing means and the object surface by the same degree as the portion of the projection axis is deflected, thereby ensuring the axes portions which are aligned to be coplanar remain coplanar, and that the image of the spot on the object surface will be properly conveyed to the linear sensor array in the sensing means.