The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 1988
Filed:
Apr. 03, 1987
Shunji Sakamoto, Hiroshima, JP;
Yukio Munenaga, Hiroshima, JP;
Mazda Motor Corporation, , JP;
Abstract
A part incorporating system includes a plurality of visual sensors at a detecting station immediately upstream of an incorporating station and respectively detect the positions of reference points in the base material when the base material is supplied to the detecting station, a plurality of second visual sensors at the incorporating station and respectively detect the positions of the reference points when the base material is supplied to the incorporating station, an incorporating unit at the incorporating station to support the part so that the position of the part can be adjusted and which has a fastening device for incorporating the part in the base material, and a control means which calculates the position in which the part is to be incorporated in the base material and controls the incorporating unit to adjust the position of the part. The part incorporating position is basically calculated based on the positions of the referenc epoints detected by the second visual sensors, and when the values of the distances between the reference points detected by the second visual sensors differ from those detected by the first visual sensors by a predetermined value, then the part incorporating position is calculated on the basis of the detected positions of the reference points which provides the values of the distances between the reference points closer to the regular values.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile