The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 1988
Filed:
Dec. 16, 1986
Masami Sugiyama, Toyonaka, JP;
Yoshihiro Tasaka, Nishinomiya, JP;
Minolta Camera Kabushiki Kaisha, Osaka, JP;
Abstract
A photoelectric colorimeter which comprises a photoelectric conversion section including an optical filter to analyze light coming from a test piece and a reference calibrating sample into primary color elements, and a photosensor to convert each of said primary color elements into an electric signal; and a data processing section including a calibration constant calculating device for calculating a calibration constant for each of a plurality of reference calibrating samples on the basis of a calibration point of each of the reference calibrating samples and an information inputted from said photoelectric conversion section, a chromaticity point calculation device for calculating a chromaticity point of the test piece and that of each reference calibrating sample, a memory device for memorizing the calibration constant and calibration point of each of the reference calibrating samples, a device for estimating a new calibration constant suitable for the chromaticity point of the test piece between the respective calibration constants of the reference calibrating samples through the interpolation using a positional relation between the chromaticity point of the calibration point and that of the test piece as a parameter, and a correction device for correcting measured value of the test piece by the new calibration constant.