The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 1988
Filed:
Dec. 28, 1987
Jonathan M Maram, Chatsworth, CA (US);
Ray C Delcher, Canoga Park, CA (US);
Rockwell International Corporation, El Segundo, CA (US);
Abstract
A method for detecting, locating and measuring leaks in a test object is described using a differential absorption technique. In a preferred embodiment the test object is first pressurized with a light absorbing fluid. The test object is then illuminated with a light source at a wavelength which is capable of being absorbed by the absorbing fluid. An image of the test object and any fluid in the vicinity of the test object is created by means of a video camera directed toward the test object and that image is electronically stored. A second image is then created in such a manner that any absorbing fluid in the vicinity of the test object does not appear in that second image. The second image is also electronically stored. The electronically stored information regarding the first and second images are then compared and analyzed for detecting, locating and measuring any leaking fluid from the test object.