The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 1988
Filed:
Feb. 02, 1987
Carlo P Croce, Leonia, NJ (US);
Sami A Halaby, Kinnelon, NJ (US);
Arthur R Oefinger, Stratford, CT (US);
Warner-Lambert Company, Morris Plains, NJ (US);
Abstract
Method and apparatus for testing hermetic seal integrity of sealed packages and containers, are provided. The method includes placing a sealed test package having at least one semi-flexible surface, within a test chamber. The pressure within the test chamber is changed from a first value to a second value, over the time interval of a test cycle. During the time interval of the test cycle, both the pressure within the test chamber and the displacement of the semi-flexible surface of the test package are continuously measured, and produced therefrom, are a first analog data signal proportional to the pressure within the test chamber, and a second analog data signal proportional to the displacement of the semi-flexible surface of the test package. During the time interval of the test cycle, the first analog data signal is converted into a first discrete data sequence, and the second analog data signal is converted into a second discrete data sequence. From the first discrete data sequence and the second discrete data sequence, a correlation estimate is computed in accordance with principles of statistical analysis, as to provide a reliable measure of hermetic seal integrity of the test package.